TY  - THES
TY  - BOOK
T1  - Multiple and solid data background scheme for testing static single cell faults on SRAM memories
A1  - Nor Azura Zakria,
LA  - English
UL  - http://discoverylib.upm.edu.my/discovery/Record/581967
CN  - FK 2013 142
KW  - Metal oxide semiconductors, Complementary.
KW  - Computer storage devices : Design and construction.
ER  -