Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002 /

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in...

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مؤلف مشترك:	SpringerLink (Online service)
مؤلفون آخرون:	Vilarinho, Paula M. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Rosenwaks, Yossi. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Kingon, Angus. (المحرر, http://id.loc.gov/vocabulary/relators/edt)
التنسيق:	الكتروني كتاب الكتروني
اللغة:	English
منشور في:	Dordrecht : Springer Netherlands : Imprint: Springer, 2005.
الطبعة:	1st ed. 2005.
سلاسل:	Nato Science Series II:, Mathematics, Physics and Chemistry, 186
الموضوعات:	Condensed matter. Optical materials. Electronic materials. Nanotechnology. Materials—Surfaces. Thin films. Condensed Matter Physics. Optical and Electronic Materials. Surfaces and Interfaces, Thin Films.
الوصول للمادة أونلاين:	https://doi.org/10.1007/1-4020-3019-3
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!