Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002 /

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in...

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企业作者:	SpringerLink (Online service)
其他作者:	Vilarinho, Paula M. (Editor, http://id.loc.gov/vocabulary/relators/edt), Rosenwaks, Yossi. (Editor, http://id.loc.gov/vocabulary/relators/edt), Kingon, Angus. (Editor, http://id.loc.gov/vocabulary/relators/edt)
格式:	电子 电子书
语言:	English
出版:	Dordrecht : Springer Netherlands : Imprint: Springer, 2005.
版:	1st ed. 2005.
丛编:	Nato Science Series II:, Mathematics, Physics and Chemistry, 186
主题:	Condensed matter. Optical materials. Electronic materials. Nanotechnology. Materials—Surfaces. Thin films. Condensed Matter Physics. Optical and Electronic Materials. Surfaces and Interfaces, Thin Films.
在线阅读:	https://doi.org/10.1007/1-4020-3019-3
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