Garg, R. (2010). Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations (1st ed. 2010.). New York, NY: Springer US : Imprint: Springer.
Citación estilo ChicagoGarg, Rajesh. Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations. 1st ed. 2010. New York, NY: Springer US : Imprint: Springer, 2010.
Cita MLAGarg, Rajesh. Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations. 1st ed. 2010. New York, NY: Springer US : Imprint: Springer, 2010.
Warning: These citations may not always be 100% accurate.
      