Garg, R. (2010). Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations (1st ed. 2010.). New York, NY: Springer US : Imprint: Springer.
Styl ChicagoGarg, Rajesh. Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations. 1st ed. 2010. New York, NY: Springer US : Imprint: Springer, 2010.
Citace podle MLAGarg, Rajesh. Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations. 1st ed. 2010. New York, NY: Springer US : Imprint: Springer, 2010.
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