Garg, R. (2010). Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations (1st ed. 2010.). New York, NY: Springer US : Imprint: Springer.
Chicago Style CitationGarg, Rajesh. Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations. 1st ed. 2010. New York, NY: Springer US : Imprint: Springer, 2010.
MLA引文Garg, Rajesh. Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations. 1st ed. 2010. New York, NY: Springer US : Imprint: Springer, 2010.
警告:这些引文格式不一定是100%准确.
