APA Citation

Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., & Virazel, A. (2010). Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies (1st ed. 2010.). New York, NY: Springer US : Imprint: Springer.

Chicago Style Citation

Bosio, Alberto., Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, and Arnaud Virazel. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. 1st ed. 2010. New York, NY: Springer US : Imprint: Springer, 2010.

MLA Citation

Bosio, Alberto., et al. Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. 1st ed. 2010. New York, NY: Springer US : Imprint: Springer, 2010.

Warning: These citations may not always be 100% accurate.