TY  - GEN
TY  - GEN
T1  - Advanced Computing in Electron Microscopy
A1  - Kirkland, Earl J.
LA  - English
PP  - New York, NY
PB  - Springer US : Imprint: Springer
YR  - 2010
ED  - 2nd ed. 2010.
UL  - http://discoverylib.upm.edu.my/discovery/Record/978-1-4419-6533-2
AB  - Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field. This enhanced second edition includes: -descriptions of new developments in the field -updated references -additional material on aberration corrected instruments and confocal electron microscopy -expanded and improved examples and sections to provide stronger clarity.
OP  - 289
CN  - QC450-467
SN  - 9781441965332
KW  - Spectroscopy.
KW  - Microscopy.
KW  - Electrical engineering.
KW  - Materials science.
KW  - Numerical analysis.
KW  - Spectroscopy and Microscopy.
KW  - Electrical Engineering.
KW  - Characterization and Evaluation of Materials.
KW  - Numeric Computing.
ER  -