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Built-in-Self-Test and Digital Self-Calibration for RF SoCs

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computin...

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Bibliographische Detailangaben
Hauptverfasser: Bou-Sleiman, Sleiman. (VerfasserIn, http://id.loc.gov/vocabulary/relators/aut), Ismail, Mohammed. (http://id.loc.gov/vocabulary/relators/aut)
Körperschaft: SpringerLink (Online service)
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: New York, NY : Springer New York : Imprint: Springer, 2012.
Ausgabe:1st ed. 2012.
Schriftenreihe:SpringerBriefs in Electrical and Computer Engineering,
Schlagworte:
Electronic circuits.
Signal processing.
Image processing.
Speech processing systems.
Circuits and Systems.
Signal, Image and Speech Processing.
Electronic Circuits and Devices.
Online Zugang:https://doi.org/10.1007/978-1-4419-9548-3
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Inhaltsangabe:
  • Introduction and Motivation
  • Radio Systems Overview: Architecture, Performance and Built-in-Test
  • Efficient Testing for RF SoCs
  • RF Built-in-Self-Test
  • RF Built-in-Self-Calibration
  • Conclusions.

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