Built-in-Self-Test and Digital Self-Calibration for RF SoCs
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computin...
Saved in:
| Main Authors: | , |
|---|---|
| Údar Corparáideach: | |
| Formáid: | Leictreonach ríomhLeabhar |
| Teanga: | English |
| Foilsithe: |
New York, NY :
Springer New York : Imprint: Springer,
2012.
|
| Eagrán: | 1st ed. 2012. |
| Sraith: | SpringerBriefs in Electrical and Computer Engineering,
|
| Ábhair: | |
| Rochtain Ar Líne: | https://doi.org/10.1007/978-1-4419-9548-3 |
| Clibeanna: |
Cuir Clib Leis
Gan Chlibeanna, Bí ar an gcéad duine leis an taifead seo a chlibeáil!
|
Clár Ábhair:
- Introduction and Motivation
- Radio Systems Overview: Architecture, Performance and Built-in-Test
- Efficient Testing for RF SoCs
- RF Built-in-Self-Test
- RF Built-in-Self-Calibration
- Conclusions.