Built-in-Self-Test and Digital Self-Calibration for RF SoCs
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computin...
שמור ב:
| Main Authors: | , |
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| מחבר תאגידי: | |
| פורמט: | אלקטרוני ספר אלקטרוני |
| שפה: | English |
| יצא לאור: |
New York, NY :
Springer New York : Imprint: Springer,
2012.
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| מהדורה: | 1st ed. 2012. |
| סדרה: | SpringerBriefs in Electrical and Computer Engineering,
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| נושאים: | |
| גישה מקוונת: | https://doi.org/10.1007/978-1-4419-9548-3 |
| תגים: |
הוספת תג
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תוכן הענינים:
- Introduction and Motivation
- Radio Systems Overview: Architecture, Performance and Built-in-Test
- Efficient Testing for RF SoCs
- RF Built-in-Self-Test
- RF Built-in-Self-Calibration
- Conclusions.