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Built-in-Self-Test and Digital Self-Calibration for RF SoCs

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computin...

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Auteurs principaux: Bou-Sleiman, Sleiman. (Auteur, http://id.loc.gov/vocabulary/relators/aut), Ismail, Mohammed. (http://id.loc.gov/vocabulary/relators/aut)
Collectivité auteur: SpringerLink (Online service)
Format: Électronique eBook
Langue:English
Publié: New York, NY : Springer New York : Imprint: Springer, 2012.
Édition:1st ed. 2012.
Collection:SpringerBriefs in Electrical and Computer Engineering,
Sujets:
Electronic circuits.
Signal processing.
Image processing.
Speech processing systems.
Circuits and Systems.
Signal, Image and Speech Processing.
Electronic Circuits and Devices.
Accès en ligne:https://doi.org/10.1007/978-1-4419-9548-3
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https://doi.org/10.1007/978-1-4419-9548-3

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