Built-in-Self-Test and Digital Self-Calibration for RF SoCs
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computin...
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| Main Authors: | , |
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| 企业作者: | |
| 格式: | 电子 电子书 |
| 语言: | English |
| 出版: |
New York, NY :
Springer New York : Imprint: Springer,
2012.
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| 版: | 1st ed. 2012. |
| 丛编: | SpringerBriefs in Electrical and Computer Engineering,
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| 主题: | |
| 在线阅读: | https://doi.org/10.1007/978-1-4419-9548-3 |
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