Life-Cycle Assessment of Semiconductors

Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information te...

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書目詳細資料
主要作者: Boyd, Sarah B. (Author, http://id.loc.gov/vocabulary/relators/aut)
企業作者: SpringerLink (Online service)
格式: 電子 電子書
語言:English
出版: New York, NY : Springer New York : Imprint: Springer, 2012.
版:1st ed. 2012.
主題:
在線閱讀:https://doi.org/10.1007/978-1-4419-9988-7
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書本目錄:
  • 1 Introduction
  • 2 Semiconductor LCI Methods
  • 3 Semiconductor Manufacturing Trends in Product Type and Geography
  • 4 Life-cycle Energy and Global Warming Emissions of CMOS Logic
  • 5 Life-cycle Assessment of CMOS Logic
  • 6 Life-cycle Assessment of Flash Memory
  • 7 Life-cycle Assessment of Dynamic Random Access Memory
  • 8 Semiconductor LCA: The Road Ahead.