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Helium Ion Microscopy Principles and Applications /

Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century. Topics covered includ...

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Hlavní autor: Joy, David C. (Autor, http://id.loc.gov/vocabulary/relators/aut)
Korporativní autor: SpringerLink (Online service)
Médium: Elektronický zdroj E-kniha
Jazyk:English
Vydáno: New York, NY : Springer New York : Imprint: Springer, 2013.
Vydání:1st ed. 2013.
Edice:SpringerBriefs in Materials,
Témata:
Materials science.
Spectroscopy.
Microscopy.
Nanotechnology.
Nanoscale science.
Nanoscience.
Nanostructures.
Characterization and Evaluation of Materials.
Spectroscopy and Microscopy.
Spectroscopy/Spectrometry.
Nanoscale Science and Technology.
On-line přístup:https://doi.org/10.1007/978-1-4614-8660-2
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Internet

https://doi.org/10.1007/978-1-4614-8660-2

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