Helium Ion Microscopy Principles and Applications /
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century. Topics covered includ...
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| 格式: | 电子 电子书 |
| 语言: | English |
| 出版: |
New York, NY :
Springer New York : Imprint: Springer,
2013.
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| 版: | 1st ed. 2013. |
| 丛编: | SpringerBriefs in Materials,
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| 主题: | |
| 在线阅读: | https://doi.org/10.1007/978-1-4614-8660-2 |
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