صورة الغلاف

System-level Test and Validation of Hardware/Software Systems

New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. As well as giving rise to new design practices,...

وصف كامل

محفوظ في:
التفاصيل البيبلوغرافية
مؤلف مشترك: SpringerLink (Online service)
مؤلفون آخرون: Sonza Reorda, Matteo. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Peng, Zebo. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Violante, Massimo. (المحرر, http://id.loc.gov/vocabulary/relators/edt)
التنسيق: الكتروني كتاب الكتروني
اللغة:English
منشور في: London : Springer London : Imprint: Springer, 2005.
الطبعة:1st ed. 2005.
سلاسل:Springer Series in Advanced Microelectronics, 17
الموضوعات:
Electronic circuits.
Electronics.
Microelectronics.
Engineering design.
Computer hardware.
Computer programming.
Condensed matter.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Engineering Design.
Computer Hardware.
Programming Techniques.
Condensed Matter Physics.
الوصول للمادة أونلاين:https://doi.org/10.1007/1-84628-145-8
الوسوم: إضافة وسم
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جدول المحتويات:
  • Modeling Permanent Faults
  • Test Generation: A Symbolic Approach
  • Test Generation: A Heuristic Approach
  • Test Generation: A Hierarchical Approach
  • Test Program Generation from High-level Microprocessor Descriptions
  • Tackling Concurrency and Timing Problems
  • An Approach to System-level Design for Test
  • System-level Dependability Analysis.

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