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System-level Test and Validation of Hardware/Software Systems

New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. As well as giving rise to new design practices,...

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Detalles Bibliográficos
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Sonza Reorda, Matteo. (Editor , http://id.loc.gov/vocabulary/relators/edt), Peng, Zebo. (Editor , http://id.loc.gov/vocabulary/relators/edt), Violante, Massimo. (Editor , http://id.loc.gov/vocabulary/relators/edt)
Formato: Electrónico eBook
Lenguaje:English
Publicado: London : Springer London : Imprint: Springer, 2005.
Edición:1st ed. 2005.
Series:Springer Series in Advanced Microelectronics, 17
Materias:
Electronic circuits.
Electronics.
Microelectronics.
Engineering design.
Computer hardware.
Computer programming.
Condensed matter.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Engineering Design.
Computer Hardware.
Programming Techniques.
Condensed Matter Physics.
Acceso en línea:https://doi.org/10.1007/1-84628-145-8
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Tabla de Contenidos:
  • Modeling Permanent Faults
  • Test Generation: A Symbolic Approach
  • Test Generation: A Heuristic Approach
  • Test Generation: A Hierarchical Approach
  • Test Program Generation from High-level Microprocessor Descriptions
  • Tackling Concurrency and Timing Problems
  • An Approach to System-level Design for Test
  • System-level Dependability Analysis.

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