Beeld op de omslag

Applied Scanning Probe Methods IX Characterization /

The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VII...

Volledige beschrijving

Bewaard in:
Bibliografische gegevens
Coauteur: SpringerLink (Online service)
Andere auteurs: Bhushan, Bharat. (Redacteur, http://id.loc.gov/vocabulary/relators/edt), Fuchs, Harald. (Redacteur, http://id.loc.gov/vocabulary/relators/edt), Tomitori, Masahiko. (Redacteur, http://id.loc.gov/vocabulary/relators/edt)
Formaat: Elektronisch E-boek
Taal:English
Gepubliceerd in: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
Editie:1st ed. 2008.
Reeks:NanoScience and Technology,
Onderwerpen:
Nanotechnology.
Spectroscopy.
Microscopy.
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Materials—Surfaces.
Polymers  .
Nanotechnology and Microengineering.
Spectroscopy and Microscopy.
Surface and Interface Science, Thin Films.
Surfaces and Interfaces, Thin Films.
Polymer Sciences.
Online toegang:https://doi.org/10.1007/978-3-540-74083-4
Tags: Voeg label toe
Geen labels, Wees de eerste die dit record labelt!

Internet

https://doi.org/10.1007/978-3-540-74083-4

Gelijkaardige items