Taula de continguts: X-Ray Diffraction Crystallography

X-Ray Diffraction Crystallography Introduction, Examples and Solved Problems /

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of...

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Autors principals:	Waseda, Yoshio. (Autor, http://id.loc.gov/vocabulary/relators/aut), Matsubara, Eiichiro. (http://id.loc.gov/vocabulary/relators/aut), Shinoda, Kozo. (http://id.loc.gov/vocabulary/relators/aut)
Autor corporatiu:	SpringerLink (Online service)
Format:	Electrònic eBook
Idioma:	English
Publicat:	Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2011.
Edició:	1st ed. 2011.
Matèries:	Materials science. Crystallography. Nanotechnology. Solid state physics. Spectroscopy. Microscopy. Characterization and Evaluation of Materials. Crystallography and Scattering Methods. Nanotechnology and Microengineering. Solid State Physics. Spectroscopy and Microscopy.
Accés en línia:	https://doi.org/10.1007/978-3-642-16635-8
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!

Taula de continguts:

Fundamental Properties of X-rays
Geometry of Crystals
Scattering and Diffraction by Atoms and Crystals
Diffraction from a Polycrystalline Sample and its Application to Determination of Crystal Structures
Reciprocal Lattice and Integrated Intensity from Crystals
Symmetry Analysis for Crystals and the Use of International Tables
Solved Problems.

X-Ray Diffraction Crystallography Introduction, Examples and Solved Problems /

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