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X-Ray Diffraction Crystallography Introduction, Examples and Solved Problems /

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of...

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Hlavní autoři: Waseda, Yoshio. (Autor, http://id.loc.gov/vocabulary/relators/aut), Matsubara, Eiichiro. (http://id.loc.gov/vocabulary/relators/aut), Shinoda, Kozo. (http://id.loc.gov/vocabulary/relators/aut)
Korporativní autor: SpringerLink (Online service)
Médium: Elektronický zdroj E-kniha
Jazyk:English
Vydáno: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2011.
Vydání:1st ed. 2011.
Témata:
Materials science.
Crystallography.
Nanotechnology.
Solid state physics.
Spectroscopy.
Microscopy.
Characterization and Evaluation of Materials.
Crystallography and Scattering Methods.
Nanotechnology and Microengineering.
Solid State Physics.
Spectroscopy and Microscopy.
On-line přístup:https://doi.org/10.1007/978-3-642-16635-8
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Obsah:
  • Fundamental Properties of X-rays
  • Geometry of Crystals
  • Scattering and Diffraction by Atoms and Crystals
  • Diffraction from a Polycrystalline Sample and its Application to Determination of Crystal Structures
  • Reciprocal Lattice and Integrated Intensity from Crystals
  • Symmetry Analysis for Crystals and the Use of International Tables
  • Solved Problems.

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