X-Ray Diffraction Crystallography Introduction, Examples and Solved Problems /
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of...
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                  | 主要な著者: | , , | 
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| 団体著者: | |
| フォーマット: | 電子媒体 eBook | 
| 言語: | English | 
| 出版事項: | Berlin, Heidelberg :
        Springer Berlin Heidelberg : Imprint: Springer,
    
      2011. | 
| 版: | 1st ed. 2011. | 
| 主題: | |
| オンライン・アクセス: | https://doi.org/10.1007/978-3-642-16635-8 | 
| タグ: | タグ追加 
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                目次: 
            
                  - Fundamental Properties of X-rays
- Geometry of Crystals
- Scattering and Diffraction by Atoms and Crystals
- Diffraction from a Polycrystalline Sample and its Application to Determination of Crystal Structures
- Reciprocal Lattice and Integrated Intensity from Crystals
- Symmetry Analysis for Crystals and the Use of International Tables
- Solved Problems.



