Inhoudsopgave: X-Ray Diffraction Crystallography

X-Ray Diffraction Crystallography Introduction, Examples and Solved Problems /

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of...

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Bibliografische gegevens
Hoofdauteurs:	Waseda, Yoshio. (Auteur, http://id.loc.gov/vocabulary/relators/aut), Matsubara, Eiichiro. (http://id.loc.gov/vocabulary/relators/aut), Shinoda, Kozo. (http://id.loc.gov/vocabulary/relators/aut)
Coauteur:	SpringerLink (Online service)
Formaat:	Elektronisch E-boek
Taal:	English
Gepubliceerd in:	Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2011.
Editie:	1st ed. 2011.
Onderwerpen:	Materials science. Crystallography. Nanotechnology. Solid state physics. Spectroscopy. Microscopy. Characterization and Evaluation of Materials. Crystallography and Scattering Methods. Nanotechnology and Microengineering. Solid State Physics. Spectroscopy and Microscopy.
Online toegang:	https://doi.org/10.1007/978-3-642-16635-8
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Inhoudsopgave:

Fundamental Properties of X-rays
Geometry of Crystals
Scattering and Diffraction by Atoms and Crystals
Diffraction from a Polycrystalline Sample and its Application to Determination of Crystal Structures
Reciprocal Lattice and Integrated Intensity from Crystals
Symmetry Analysis for Crystals and the Use of International Tables
Solved Problems.

X-Ray Diffraction Crystallography Introduction, Examples and Solved Problems /

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