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X-Ray Diffraction Crystallography Introduction, Examples and Solved Problems /

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of...

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Những tác giả chính: Waseda, Yoshio. (Tác giả, http://id.loc.gov/vocabulary/relators/aut), Matsubara, Eiichiro. (http://id.loc.gov/vocabulary/relators/aut), Shinoda, Kozo. (http://id.loc.gov/vocabulary/relators/aut)
Tác giả của công ty: SpringerLink (Online service)
Định dạng: Điện tử eBook
Ngôn ngữ:English
Được phát hành: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2011.
Phiên bản:1st ed. 2011.
Những chủ đề:
Materials science.
Crystallography.
Nanotechnology.
Solid state physics.
Spectroscopy.
Microscopy.
Characterization and Evaluation of Materials.
Crystallography and Scattering Methods.
Nanotechnology and Microengineering.
Solid State Physics.
Spectroscopy and Microscopy.
Truy cập trực tuyến:https://doi.org/10.1007/978-3-642-16635-8
Các nhãn: Thêm thẻ
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Mục lục:
  • Fundamental Properties of X-rays
  • Geometry of Crystals
  • Scattering and Diffraction by Atoms and Crystals
  • Diffraction from a Polycrystalline Sample and its Application to Determination of Crystal Structures
  • Reciprocal Lattice and Integrated Intensity from Crystals
  • Symmetry Analysis for Crystals and the Use of International Tables
  • Solved Problems.

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