New Trends in Image Analysis and Processing, ICIAP 2013 Workshops Naples, Italy, September 2013, Proceedings /

This book constitutes the refereed proceedings of the workshops held with the 17th International Conference on Image Analysis and Processing, ICIAP 2013, held in Naples, Italy, in September 2013. The proceedings include papers from the five individual workshops focusing on topics of interest to the...

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محفوظ في:
التفاصيل البيبلوغرافية
مؤلف مشترك: SpringerLink (Online service)
مؤلفون آخرون: Petrosino, Alfredo. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Maddalena, Lucia. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Pala, Pietro. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Cantoni, Virginio. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Ceccarelli, Michele. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Murphy, Robert F. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Del Bimbo, Alberto. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Pantic, Maja. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Grana, Costantino. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Oomen, Johan. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Serra, Giuseppe. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Leo, Marco. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Mandic, Danilo P. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Pirlo, Giuseppe. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Fairhurst, Michael. (المحرر, http://id.loc.gov/vocabulary/relators/edt), Impedovo, Donato. (المحرر, http://id.loc.gov/vocabulary/relators/edt)
التنسيق: الكتروني كتاب الكتروني
اللغة:English
منشور في: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
الطبعة:1st ed. 2013.
سلاسل:Image Processing, Computer Vision, Pattern Recognition, and Graphics ; 8158
الموضوعات:
الوصول للمادة أونلاين:https://doi.org/10.1007/978-3-642-41190-8
الوسوم: إضافة وسم
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جدول المحتويات:
  • Pattern recognition
  • Image analysis
  • Computer vision.- Links with related fields and / or application areas.