New Trends in Image Analysis and Processing, ICIAP 2013 Workshops Naples, Italy, September 2013, Proceedings /

This book constitutes the refereed proceedings of the workshops held with the 17th International Conference on Image Analysis and Processing, ICIAP 2013, held in Naples, Italy, in September 2013. The proceedings include papers from the five individual workshops focusing on topics of interest to the...

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Xehetasun bibliografikoak
Erakunde egilea: SpringerLink (Online service)
Beste egile batzuk: Petrosino, Alfredo. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt), Maddalena, Lucia. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt), Pala, Pietro. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt), Cantoni, Virginio. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt), Ceccarelli, Michele. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt), Murphy, Robert F. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt), Del Bimbo, Alberto. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt), Pantic, Maja. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt), Grana, Costantino. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt), Oomen, Johan. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt), Serra, Giuseppe. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt), Leo, Marco. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt), Mandic, Danilo P. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt), Pirlo, Giuseppe. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt), Fairhurst, Michael. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt), Impedovo, Donato. (Argitaratzailea, http://id.loc.gov/vocabulary/relators/edt)
Formatua: Baliabide elektronikoa eBook
Hizkuntza:English
Argitaratua: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
Edizioa:1st ed. 2013.
Saila:Image Processing, Computer Vision, Pattern Recognition, and Graphics ; 8158
Gaiak:
Sarrera elektronikoa:https://doi.org/10.1007/978-3-642-41190-8
Etiketak: Etiketa erantsi
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Aurkibidea:
  • Pattern recognition
  • Image analysis
  • Computer vision.- Links with related fields and / or application areas.