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Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings /

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2014; comprising the International Workshop on Structural and Syntactic Pattern Recognition, SSPR, and the International Workshop on Statistical Techni...

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Bibliografiske detaljer
Institution som forfatter: SpringerLink (Online service)
Andre forfattere: Fränti, Pasi. (Editor, http://id.loc.gov/vocabulary/relators/edt), Brown, Gavin. (Editor, http://id.loc.gov/vocabulary/relators/edt), Loog, Marco. (Editor, http://id.loc.gov/vocabulary/relators/edt), Escolano, Francisco. (Editor, http://id.loc.gov/vocabulary/relators/edt), Pelillo, Marcello. (Editor, http://id.loc.gov/vocabulary/relators/edt)
Format: Electronisk eBog
Sprog:English
Udgivet: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
Udgivelse:1st ed. 2014.
Serier:Image Processing, Computer Vision, Pattern Recognition, and Graphics ; 8621
Fag:
Artificial intelligence.
Pattern recognition.
Application software.
Database management.
Algorithms.
Data mining.
Artificial Intelligence.
Pattern Recognition.
Information Systems Applications (incl. Internet).
Database Management.
Algorithm Analysis and Problem Complexity.
Data Mining and Knowledge Discovery.
Online adgang:https://doi.org/10.1007/978-3-662-44415-3
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Beskrivelse
Summary:This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2014; comprising the International Workshop on Structural and Syntactic Pattern Recognition, SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The total of 25 full papers and 22 poster papers included in this book were carefully reviewed and selected from 78 submissions. They are organized in topical sections named: graph kernels; clustering; graph edit distance; graph models and embedding; discriminant analysis; combining and selecting; joint session; metrics and dissimilarities; applications; partial supervision; and poster session.
Fysisk beskrivelse:XX, 478 p. 124 illus. online resource.
ISBN:9783662444153

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