Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings /

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2014; comprising the International Workshop on Structural and Syntactic Pattern Recognition, SSPR, and the International Workshop on Statistical Techni...

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書目詳細資料
企業作者: SpringerLink (Online service)
其他作者: Fränti, Pasi. (Editor, http://id.loc.gov/vocabulary/relators/edt), Brown, Gavin. (Editor, http://id.loc.gov/vocabulary/relators/edt), Loog, Marco. (Editor, http://id.loc.gov/vocabulary/relators/edt), Escolano, Francisco. (Editor, http://id.loc.gov/vocabulary/relators/edt), Pelillo, Marcello. (Editor, http://id.loc.gov/vocabulary/relators/edt)
格式: 電子 電子書
語言:English
出版: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
版:1st ed. 2014.
叢編:Image Processing, Computer Vision, Pattern Recognition, and Graphics ; 8621
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在線閱讀:https://doi.org/10.1007/978-3-662-44415-3
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實物特徵
總結:This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2014; comprising the International Workshop on Structural and Syntactic Pattern Recognition, SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The total of 25 full papers and 22 poster papers included in this book were carefully reviewed and selected from 78 submissions. They are organized in topical sections named: graph kernels; clustering; graph edit distance; graph models and embedding; discriminant analysis; combining and selecting; joint session; metrics and dissimilarities; applications; partial supervision; and poster session.
實物描述:XX, 478 p. 124 illus. online resource.
ISBN:9783662444153