Surface Science Tools for Nanomaterials Characterization
Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered an...
Wedi'i Gadw mewn:
| Awdur Corfforaethol: | |
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| Awduron Eraill: | |
| Fformat: | Electronig eLyfr |
| Iaith: | English |
| Cyhoeddwyd: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2015.
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| Rhifyn: | 1st ed. 2015. |
| Pynciau: | |
| Mynediad Ar-lein: | https://doi.org/10.1007/978-3-662-44551-8 |
| Tagiau: |
Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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Tabl Cynhwysion:
- Higher Resolution Scanning Probe Methods for Magnetic Imaging
- The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials
- SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography
- Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy
- Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)
- Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy
- Magnetic Force Microscopy
- High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films
- FIM-Characterized Tips for SPM
- Scanning Conductive Torsion Mode Microscopy
- Scanning Probe Acceleration Microscopy (SPAM)
- Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures
- Field Ion Microscopy (FIM)
- Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.