Surface Science Tools for Nanomaterials Characterization
Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered an...
Saved in:
| Corporate Author: | |
|---|---|
| Other Authors: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2015.
|
| Edition: | 1st ed. 2015. |
| Subjects: | |
| Online Access: | https://doi.org/10.1007/978-3-662-44551-8 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Table of Contents:
- Higher Resolution Scanning Probe Methods for Magnetic Imaging
- The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials
- SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography
- Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy
- Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)
- Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy
- Magnetic Force Microscopy
- High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films
- FIM-Characterized Tips for SPM
- Scanning Conductive Torsion Mode Microscopy
- Scanning Probe Acceleration Microscopy (SPAM)
- Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures
- Field Ion Microscopy (FIM)
- Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.