TY  - GEN
TY  - GEN
T1  - Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy
T2  - NanoScience and Technology,
A1  - Voigtländer, Bert.
LA  - English
PP  - Berlin, Heidelberg
PB  - Springer Berlin Heidelberg : Imprint: Springer
YR  - 2015
ED  - 1st ed. 2015.
UL  - http://discoverylib.upm.edu.my/discovery/Record/978-3-662-45240-0
AB  - This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
OP  - 382
CN  - T174.7
SN  - 9783662452400
KW  - Nanotechnology.
KW  - Condensed matter.
KW  - Nanotechnology and Microengineering.
KW  - Condensed Matter Physics.
ER  -