Probing Crystal Plasticity at the Nanoscales Synchrotron X-ray Microdiffraction /
This Brief highlights the search for strain gradients and geometrically necessary dislocations as a possible source of strength for two cases of deformation of materials at small scales: nanoindented single crystal copper and uniaxially compressed single crystal submicron gold pillars. When crystall...
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| Format: | Électronique eBook |
| Langue: | English |
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Singapore :
Springer Singapore : Imprint: Springer,
2015.
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| Édition: | 1st ed. 2015. |
| Collection: | SpringerBriefs in Applied Sciences and Technology,
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| Accès en ligne: | https://doi.org/10.1007/978-981-287-335-4 |
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Table des matières:
- From the Contents: Introduction
- Synchrotron White-beam X-ray Microdiffraction at the Advanced Light Source, Berkeley Lab
- Electromigration-induced Plasticity in Cu Interconnects: The Length Scale Dependence.