Direct and indirect entrance surface dose measurement in X-ray diagnostics using nanoDot OSL dosimeters

This study investigated the suitability of nanoDot optically stimulated luminescence (OSL) dosimeters for entrance surface dose (ESD) measurements in common X-ray diagnostics. OSL dosimetry system supplied by Landauer Inc, (Glenwood, IL, USA) consisting of nanoDot OSL dosimeters and microStar reader...

詳細記述

保存先:
書誌詳細
主要な著者: Musa, Yahaya, Hashim, Suhairul, Abdul Karim, Muhammad Khalis
フォーマット: 論文
言語:English
出版事項: IOP Publishing 2019
オンライン・アクセス:http://psasir.upm.edu.my/id/eprint/79392/1/Direct%20and%20indirect%20entrance%20surface%20dose%20.pdf
タグ: タグ追加
タグなし, このレコードへの初めてのタグを付けませんか!