1
Published 2005
Table of Contents: ...-Integration Technology Using Dielectric Adhesive Wafer Bonding -- Advanced Materials Characterization...
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2
Published 2010
Table of Contents: ... in CT Data -- Electron Microscopy Image Segmentation with Graph Cuts Utilizing Estimated Symmetric Three...
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Electronic eBook
3
Published 2014
Table of Contents: ... Reflectance Measurement (FBRM) -- Cell Assessment by Atline Microscopy -- Seed Train Optimization for Cell...
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Electronic eBook