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Published 2005
Table of Contents: “... for Scanning Probe Microscopy -- Fundamentals of Scanning Probe Techniques -- Principles of Basic and Advanced...”
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2
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Published 2005
Table of Contents: “... of FIB Milling Processes for Optimum Accuracy -- FIB for Materials Science Applications - a Review...”
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3
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by Wang, Chen., Wang, Chen., Bai, Chunli.
Published 2006
Table of Contents: “...to Single Molecule Chemistry and Physics -- Basics of Electron Tunneling Processes and Scanning...”
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4
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Published 2011
Table of Contents: “... interface at high resolution -- 8. Delamination in timber induced by microwave energy- 9. Delamination...”
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Published 2015
Table of Contents: “... in Contact with Saline Solution: Analysis Using Electrochemical Atomic Force Microscopy -- 25 Years...”
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