1
Argitaratua 2005
Aurkibidea: ... for Scanning Probe Microscopy -- Fundamentals of Scanning Probe Techniques -- Principles of Basic and Advanced...
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Baliabide elektronikoa eBook
2
Argitaratua 2005
Aurkibidea: ... of FIB Milling Processes for Optimum Accuracy -- FIB for Materials Science Applications - a Review...
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Baliabide elektronikoa eBook
3
nork Wang, Chen., Wang, Chen., Bai, Chunli.
Argitaratua 2006
Aurkibidea: ...to Single Molecule Chemistry and Physics -- Basics of Electron Tunneling Processes and Scanning...
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Baliabide elektronikoa eBook
4
Argitaratua 2011
Aurkibidea: ... interface at high resolution -- 8. Delamination in timber induced by microwave energy- 9. Delamination...
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Baliabide elektronikoa eBook
5
Argitaratua 2015
Aurkibidea: ... in Contact with Saline Solution: Analysis Using Electrochemical Atomic Force Microscopy -- 25 Years...
Testu osoa
Baliabide elektronikoa eBook