1
Published 2005
Table of Contents: ... Scanning Probe Microscopy -- Nanoscale Probing of Physical and Chemical Functionality with Near-Field...
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2
Published 2007
Table of Contents: ... Attach Quality Testing by Structure Function Evaluation -- Mechanical Behavior of Flip Chip Packages...
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3
Published 2015
Table of Contents: ... semiconductors and their interfaces: Experimental electronic structure of organic-device related systems...
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4
Published 2005
Table of Contents: ...: Applications to Direct Tunneling and Defects at Dielectric Interfaces -- Atomic Structure, Interfaces...
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5
Published 2014
Table of Contents: ...The Scanning Tunneling Microscopy of Adsorbed Molecules on Semiconductors: Some Theoretical Answers...
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