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1
Published 2011
Table of Contents: ... Holographic Microscopy with Femtosecond Laser Sources for Characterization of Fast Dynamic Events and Process...
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2
Published 2005
Table of Contents: ... -- Processed Silicon and Other Device Materials -- Device Studies -- Scanning Electron and Scanning Probe...
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3
Table of Contents: ...Principles: Theory and Practice -- Physical Principles of Scanning Probe Microscopy Imaging...
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4
Published 2008
Table of Contents: ... and Nanoanalysis -- Self-Organised and Quantum Domain Structures -- Processed Silicon and Other Device Materials...
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5
Published 2011
Table of Contents: ... Image Processing in the Diagnosis and Treatment of Spinal     Deformity -- Image Analysis of Retinal...
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6
Table of Contents: ...Fundamental principles and processes -- Simulation of cryogenic processes -- Need for refrigerant...
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7
by Kitchin, C. R., Kitchin, C. R.
Published 2013
Table of Contents: ... -- Chapter 10: Data Processing -- Chapter 11: Photometry -- Chapter 12: Spectroscopy -- Appendix A...
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8
Table of Contents: ...Single Crystal Growth -- Semiconductor Device Technology -- Semiconductor Device Processing...
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9
Published 2008
Subjects: ...Spectroscopy and Microscopy. https://scigraph.springernature.com/ontologies/product-market-codes/P...
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10
Published 2014
Table of Contents: ... Grown Semipolar {20-21} GaN on Patterned Sapphire Substrate -- Development of a Low-Noise Three...
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11
Published 2013
Subjects: ...Spectroscopy and Microscopy. https://scigraph.springernature.com/ontologies/product-market-codes/P...
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12
Published 2006
Table of Contents: ... of Nanometer-Scale Particle Arrays -- Processing and Modeling of Novel Nanocrystalline Soft Magnetic Materials...
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13
Published 2010
Table of Contents: ... to Cancer Research Via Nanotechnology -- Recent Developments in Polarized Line Formation in Magnetic Fields...
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14
by Rockett, Angus., Rockett, Angus.
Published 2008
Table of Contents: ... -- Amorphous Semiconductors -- Organic Semiconductors -- Thin Film Growth Processes -- Physical Vapor...
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15
Published 2008
Table of Contents: ... and their Characterization by Scanning Probe Microscopy -- Functionally Graded Polar Heterostuctures: New Materials...
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16
Published 2008
Table of Contents: ... -- Semiconductor nanocrystal-polymer composites: using polymers for nanocrystal processing -- Layer-by-layer (LBL...
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17
Published 2005
Table of Contents: ... of FIB Milling Processes for Optimum Accuracy -- FIB for Materials Science Applications - a Review...
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18
Published 2007
Table of Contents: ... Lead-Free Interconnections -- Metallurgy, Processing and Reliability of Lead-Free Solder Joint...
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19
Published 2010
Table of Contents: ... Characterization of Crystals -- Defect-Selective Etching of Semiconductors -- Transmission Electron Microscopy...
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20
Published 2008
Table of Contents: ... methods -- SEM/FIB Instrumentation and Methods -- Other Microscopies -- Image analysis and Processing...
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