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Ahmed, Rabah Abood
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Ahmed, Rabah Abood
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Ahmed, Rabah Abood
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Fault tolerance of L1 data cache memory induced by intrinsic parameters fluctuation in sub 10nm UTB-SOI MOSFETs /
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,
Rabah
Abood
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Fault tolerance of L1 data cache memory induced by intrinsic parameters fluctuation in sub 10nm UTB-SOI MOSFETs
by
Ahmed
,
Rabah
Abood
Published 2013
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3
Fault tolerance of L1 data cache memory induced by intrinsic parameters fluctuation in sub 10nm UTB-SOI MOSFETs
by
Ahmed
,
Rabah
Abood
Published 2013
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4
A framework for system dependability validation under the influence of intrinsic parameters fluctuation
by
Ahmed
,
Rabah
Abood
,
Samsudin, Khairulmizam
,
Rokhani, Fakhrul Zaman
Published 2014
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5
Impact of intrinsic parameter fluctuation on the fault tolerance of L1 data cache
by
Ahmed
,
Rabah
Abood
,
Samsudin, Khairulmizam
,
Rokhani, Fakhrul Zaman
Published 2009
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Related Subjects
Cache memory
Metal oxide semiconductor field-effect transistors
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