X-Ray diffraction analysis of thermally evaporated copper tin selenide thin films at different annealing temperature.

by Talib, Zainal Abidin, Mat Yunus, Wan Mahmood, Mohd Yunos, Mohd Amirul Syafiq, Meor Sulaiman, Meor Yusoff, Paulus, Wilfred Sylvester
Published 2010