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Tan, Cher Ming.
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Tan, Cher Ming.
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Tan, Cher Ming.
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1
Electromigration Modeling at Circuit Layout Level
by
Tan
,
Cher
Ming
.
,
Tan
,
Cher
Ming
.
,
He, Feifei.
Published 2013
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2
Electromigration in ULSI interconnections /
by
Tan
,
Cher
Ming
, 1959-.
Published 2010
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3
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
by
Tan
,
Cher
Ming
.
,
Tan
,
Cher
Ming
.
,
Li, Wei.
,
Gan, Zhenghao.
,
Hou, Yuejin.
Published 2011
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