Holdings: Metrology at nanoscale :

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Bibliographic Details
Main Author:	Mohd. Maarof H. A. Moksin, Prof. Dr., (Author)
Corporate Author:	Universiti Putra Malaysia.
Format:	Book
Language:	English
Published:	Serdang : Universiti Putra Malaysia, 2008.
Series:	Inaugural lecture series ; (Universiti Putra Malaysia) ; no.109.
Subjects:	Nanotechnology. Nanostructures > Measurement. Microstructure > Measurement. Nanostructured materials > Measurement.
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