Atomic and nuclear analytical methods : XRF, M�ossbauer, XPS, NAA and ion-beam spectroscopic techniques /
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
2007.
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| Subjects: | |
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| Physical Description: | 375p. : ill. ; 24cm. |
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| ISBN: | 9783540302773 3540302778 |