Independent component analyses, wavelets, unsupervised nano-biomimetic sensors, and neural networks V : 10-13 April 2007, Orlando, Florida, USA /
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Corporate Authors: | , |
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Other Authors: | , |
Format: | Conference Proceeding Book |
Language: | English |
Published: |
Bellingham, Wash. :
SPIE,
2007.
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Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 6576. |
Subjects: | |
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