X-ray diffraction for materials research : from fundamentals to applications /

"X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of th...

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Bibliographic Details
Main Author: Lee, Myeongkyu, author.
Format: Book
Language:English
Published: Oakville, ON, Canada ; Waretown, NJ, USA : Apple Academic Press, 2016.
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