Advanced Computing in Electron Microscopy
Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. T...
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| 主要作者: | |
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| 企業作者: | |
| 格式: | 電子 電子書 |
| 語言: | English |
| 出版: |
New York, NY :
Springer US : Imprint: Springer,
2010.
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| 版: | 2nd ed. 2010. |
| 主題: | |
| 在線閱讀: | https://doi.org/10.1007/978-1-4419-6533-2 |
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| 245 | 1 | 0 | |a Advanced Computing in Electron Microscopy |h [electronic resource] / |c by Earl J. Kirkland. |
| 250 | |a 2nd ed. 2010. | ||
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| 505 | 0 | |a The Transmission Electron Microscope -- Linear Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programs -- Plotting Transfer Functions -- The Fourier Projection Theorem -- Atomic Potentials and Scattering Factors -- Bilinear Interpolation -- 3D Perspective View. | |
| 520 | |a Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field. This enhanced second edition includes: -descriptions of new developments in the field -updated references -additional material on aberration corrected instruments and confocal electron microscopy -expanded and improved examples and sections to provide stronger clarity. | ||
| 650 | 0 | |a Spectroscopy. | |
| 650 | 0 | |a Microscopy. | |
| 650 | 0 | |a Electrical engineering. | |
| 650 | 0 | |a Materials science. | |
| 650 | 0 | |a Numerical analysis. | |
| 650 | 1 | 4 | |a Spectroscopy and Microscopy. |0 https://scigraph.springernature.com/ontologies/product-market-codes/P31090 |
| 650 | 2 | 4 | |a Electrical Engineering. |0 https://scigraph.springernature.com/ontologies/product-market-codes/T24000 |
| 650 | 2 | 4 | |a Characterization and Evaluation of Materials. |0 https://scigraph.springernature.com/ontologies/product-market-codes/Z17000 |
| 650 | 2 | 4 | |a Numeric Computing. |0 https://scigraph.springernature.com/ontologies/product-market-codes/I1701X |
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