Laurila, T., Vuorinen, V., Paulasto-Kröckel, M., Turunen, M., Mattila, T. T., & Kivilahti, J. (2012). Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach (1st ed. 2012.). London: Springer London : Imprint: Springer.
Chicago Style CitationLaurila, Tomi., Vesa Vuorinen, Mervi Paulasto-Kröckel, Markus Turunen, Toni T. Mattila, and Jorma Kivilahti. Interfacial Compatibility in Microelectronics: Moving Away From the Trial and Error Approach. 1st ed. 2012. London: Springer London : Imprint: Springer, 2012.
MLA CitationLaurila, Tomi., et al. Interfacial Compatibility in Microelectronics: Moving Away From the Trial and Error Approach. 1st ed. 2012. London: Springer London : Imprint: Springer, 2012.
Warning: These citations may not always be 100% accurate.