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Modeling Nanoscale Imaging in Electron Microscopy

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Vogt, Thomas. (Editor, http://id.loc.gov/vocabulary/relators/edt), Dahmen, Wolfgang. (Editor, http://id.loc.gov/vocabulary/relators/edt), Binev, Peter. (Editor, http://id.loc.gov/vocabulary/relators/edt)
Format: Electronic eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2012.
Edition:1st ed. 2012.
Series:Nanostructure Science and Technology,
Subjects:
Materials science.
Analytical chemistry.
Nanotechnology.
Chemistry, Physical and theoretical.
Physical measurements.
Measurement   .
Characterization and Evaluation of Materials.
Analytical Chemistry.
Theoretical and Computational Chemistry.
Measurement Science and Instrumentation.
Online Access:https://doi.org/10.1007/978-1-4614-2191-7
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https://doi.org/10.1007/978-1-4614-2191-7

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