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Defects at Oxide Surfaces

This book presents the basics and characterization of defects at oxide surfaces. It provides a state-of-the-art review of the field, containing information to the various types of surface defects, describes analytical methods to study defects, their chemical activity and the catalytic reactivity of...

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Korporativní autor: SpringerLink (Online service)
Další autoři: Jupille, Jacques. (Editor, http://id.loc.gov/vocabulary/relators/edt), Thornton, Geoff. (Editor, http://id.loc.gov/vocabulary/relators/edt)
Médium: Elektronický zdroj E-kniha
Jazyk:English
Vydáno: Cham : Springer International Publishing : Imprint: Springer, 2015.
Vydání:1st ed. 2015.
Edice:Springer Series in Surface Sciences, 58
Témata:
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Optical materials.
Electronic materials.
Materials—Surfaces.
Physical chemistry.
Surface and Interface Science, Thin Films.
Optical and Electronic Materials.
Surfaces and Interfaces, Thin Films.
Physical Chemistry.
On-line přístup:https://doi.org/10.1007/978-3-319-14367-5
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