Delwedd Flaen

Defects at Oxide Surfaces

This book presents the basics and characterization of defects at oxide surfaces. It provides a state-of-the-art review of the field, containing information to the various types of surface defects, describes analytical methods to study defects, their chemical activity and the catalytic reactivity of...

Disgrifiad llawn

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Awdur Corfforaethol: SpringerLink (Online service)
Awduron Eraill: Jupille, Jacques. (Golygydd, http://id.loc.gov/vocabulary/relators/edt), Thornton, Geoff. (Golygydd, http://id.loc.gov/vocabulary/relators/edt)
Fformat: Electronig eLyfr
Iaith:English
Cyhoeddwyd: Cham : Springer International Publishing : Imprint: Springer, 2015.
Rhifyn:1st ed. 2015.
Cyfres:Springer Series in Surface Sciences, 58
Pynciau:
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Optical materials.
Electronic materials.
Materials—Surfaces.
Physical chemistry.
Surface and Interface Science, Thin Films.
Optical and Electronic Materials.
Surfaces and Interfaces, Thin Films.
Physical Chemistry.
Mynediad Ar-lein:https://doi.org/10.1007/978-3-319-14367-5
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